NT-MDT company started commercialization of the newest combined system for biological research

The developer and manufacturer of scanning probe microscopes, as well as combined systems based on them, NT-MDT LLC, in 2019, has completed the development and started the project on commercialization of the combined system NTEGRA MARLIN for biological research.

"This project is implemented with the assistance of the Innovation Assistance Fund," the company explained.

About the device

NTEGRA MARLIN is a system for biological and local electrochemical studies based on a combination of atomic force microscopy (AFM, SPM), optical spectroscopy techniques, including Raman spectroscopy (Raman spectroscopy, RAMAN) and scanning ion conducting microscopy (SMIP).

The main advantages of the device are:

• High resolution atomic force microscopy using contact, amplitude-modulation scanning mode as well as jump microscopy mode;
• Smart path-clamp method combines the conventional local potential-fixing (LFP) method and scanning ion conducting microscopy (SMIP) method. The SMIP method produces a high-resolution image of the topography. The probe is then positioned at a coordinate set on the surface for subsequent ion current recording.

"NT-MDT Ltd. employs specialists who back in 1998 were the first in the world to successfully integrate methods of atomic force microscopy, as well as methods of optical microscopy and spectroscopy. Today, the NTEGRA MARLIN system supports over 30 basic and advanced AFM techniques, including HybriD Mode, providing extensive information on the physical properties of the sample. Integration of atomic force microscopy (AFM) with confocal Raman/fluorescence microscopy provides the broadest range of additional sample information. Simultaneous acquisition of AFM and Raman images of exactly the same region of the sample provides complementary information on the physical properties (AFM) and chemical composition (Raman spectroscopy, CR) of the sample, while the combination of scanning ion conducting microscopy and HybriD Mode AFM extends the applicability of quantitative nanomechanical real-time elastic modulus mapping to 10 orders of magnitude, while still allowing for single-point force spectroscopy experiments.", explained K

Export

NT-MDT products are in demand in over 50 countries on all continents. Most of the supplied devices operate in Russia, the USA, China, as well as in Western Europe, Asia, including South Korea, Japan, Taiwan, Vietnam, India, as well as in Canada, Mexico, South America and Africa. Several scanning probe microscope instruments are also installed in Australia.

About Company

NT-MDT Limited Liability Company (NT-MDT LLC), founded in 2013, develops, manufactures and commercializes sophisticated scientific equipment such as scanning probe microscopes (SPM) and combined systems that integrate capabilities of SPM methods, optical microscopy and spectroscopy techniques.

NT-MDT employs 53 highly qualified specialists, including two doctors of sciences and eight candidates of sciences. Many of the company's employees are graduates of MIPT, MIET, MAI, Bauman Moscow State Technical University and other famous institutes. The company employs specialists, who have been successfully developing new models of sophisticated scientific equipment for over 30 years.

Over the past period NT-MDT received seven patents for invention (2695517, 2695027, 2616854, 2628673, 2629538, 2664783, 2698953) and developed, registered and certified the latest generation software for control of scanning probe microscopes, data processing and analysis (NOVA PX), an expert system for optimization of SPM "ScanTronic" as well as the service programs: "NTEGRA Base Firmware", "PX ULTRA Firmware", "PX ULTRA Loader" (certificate numbers: 201910977, 2019614250, 2019661211, 2019661212, 2019661284).

Products:

NT-MDT products are well known in Russia and worldwide under the registered trademarks "NT-MDT" and "NT-MDT Spectrum Instruments".

NT-MDT main products are:

• NTEGRA universal scanning probe microscopes;
• Automated scanning probe microscopes NEXT II;
• SPM for scientific and educational tasks SOLVER NANO and NANOEDUCATOR II;
• SPM for samples up to 200 mm or VEGA arrays;
• combined SPM and Raman spectroscopy methods NTEGRA SPECTRA II;
• The combined SPM and nanoIR spectroscopy methods NTEGRA nanoIR;
• the combined system of SPM, Raman spectroscopy and ion-conducting microscopy methods NTEGRA MARLIN.